Materials characterizations

Scanning probe Microscopy, Ntegra Prima Platform Resolution 0.1 nm Multiple modes of operation for AFM, STM, MFM Nanolithography Nanoelectrochemistry Soft materials

FT-IR- spectroscopy FT-IR Jasco 6200, 350-7800 cm-1, microscope Jasco IRT 3000 Pike module for specular reflectance ATR Monolayer detection Gas cell Multiple accessories

UV/VIS/NIR Jasco V 570 190 – 2500 nm Integrating sphere Chemical kinetics cell Cooling-Peltier Band gap Thin film thickness

Raman Spectroscopy Jasco NRS – 3100, dual laser beams, 532 nm, 785nm 50…8000 cm-1 Stokes, antistokes facilities automatic stage, mapping confocal microscope

Electrical measurements MicroTech EP4, Keithley 2600 Four points, tungsten contacts, magnetic table, vacuumatic support 0…±40V ( 1µV), 0…±1A ( 1pA)