Materials characterizations

Scanning probe Microscopy,
Ntegra Prima Platform
Resolution 0.1 nm
  • Multiple modes of operation for AFM, STM, MFM
  • Nanolithography
  • Nanoelectrochemistry
  • Soft materials
Materials characterizations
FT-IR- spectroscopy
  • FT-IR Jasco 6200, 350-7800 cm-1,
  • microscope Jasco IRT 3000
  • Pike module for specular reflectance
    • ATR
    • Monolayer detection
    • Gas cell
    • Multiple accessories
Materials characterizations
UV/VIS/NIR Jasco V 570
  • 190 – 2500 nm
    • Integrating sphere
    • Chemical kinetics cell
    • Cooling-Peltier
    • Band gap
    • Thin film thickness
Materials characterizations
Raman Spectroscopy
Jasco NRS – 3100,
  • dual laser beams, 532 nm, 785nm
  • 50…8000 cm-1
  • Stokes, antistokes facilities
  • automatic stage, mapping
  • confocal microscope
Materials characterizations
Electrical measurements
MicroTech EP4, Keithley 2600
Four points, tungsten contacts, magnetic table, vacuumatic support
  • 0…±40V ( 1µV),
  • 0…±1A ( 1pA)
Materials characterizations